Electronic & Magnetic Materials & Devices Capabilities

Synthesis

• Complex oxide film synthesis via molecular beam epitaxy (DCA R450 Custom)
• Lithographically assisted, conventional, and self-assembly techniques for novel fabrication of complex oxide nanostructures
• Nanocrystal synthesis by colloidal chemistry
• Physical vapor deposition (Lesker CMS 18 and PVD 250)

Characterization

• Characterization of electrical transport properties at the nanoscale via state-of-the-art ultrahigh-vacuum nanoprobes (4-tip SEM Omicron UHV Nanoprobe)
• Magnetic and physical properties characterization suite ( Keithley 4200-SCS/F Semiconductor Parameter Analyzer, Quantum Design PPMS-9 and MPMS XL)
• Luminescence spectrometer (Perkin-Elmer LS 55)
• Optical microscope (Zeiss Axio Imager Z1 M Upright)
• Rheometer (AntonPaar Physica MCR301)
• Scanning probe microscope [Veeco MultiMode with NanoScope V Controller, contact or tapping mode, fluid imaging, low-current scanning tunneling microscopy, magnetic force microscopy, variable temperature imaging (-30-250°C), conductive atomic force microscopy]
• Solar simulator (Oriel)
• Thermal analysis [differential scanning calorimetry (Mettler Toledo 823) and thermogravimetric analysis (Mettler Toledo 851)]
• Ultraviolet-visible-near-infrared spectrometer (Perkin-Elmer Lamda 950)
• Advanced scanning probe microscopy and spectroscopy at variable temperatures, including spin-sensitive imaging. Variable-temperature, ultra-high-vacuum, atomic force microscope (AFM)/scanning tunneling microscope (STM) (Omicron VT-AFM XA). Measurement modes include contact and non-contact AFM, magnetic force microscopy (MFM), and STM (I/V, dI/dV, I/z, etc.). 40-400 K temperature-range (tip always at room temperature); Nanonis electronics controller; load lock; preparation chamber; basic surface analysis tools. Preparation tools include resistive sample heating (<1100 K), direct current heating, e-beam heating (>2300 K), sputter ion etching (SPECS, IQE 11/35), gas dosing, and e-beam evaporation (Omicron EFM 3); analysis chamber with combined four-grid LEED/Auger optics (Omicron Spectaleed).
• Variable-temperature magneto-optical microscopy with high-resolution spectroscopy capability.
• X-ray diffractometer (Bruker D8 Discover, point detector, VÅNTEC-1 linear detector; Bragg-Brentano powder, Grazing incidence, high-resolution four-circle, reciprocal space mapping, reflectivity, rocking curves)