Electronic & Magnetic Materials & Devices Capabilities

Synthesis

• Colloidal chemistry and self-assembly techniques
• Complex oxide film synthesis via molecular beam epitaxy (DCA R450 Custom)
• Physical vapor deposition (Lesker CMS 18 and PVD 250)
• Spin coating (Laurell WS-400)

Characterization

• Variable-temperature (VT) scanning tunneling microscope with atomic force microscopy capabilities (Omicron VT-AFM/STM), operates in an ultrahigh vacuum (UHV) environment with a base pressure of < 1E-10 mbar and 55-400 K. Atomic resolution is routinely obtained at room temperature and below. The AFM capabilities support a range of scanning modes. The analysis chamber also houses a LEED/Auger with an attached preparation chamber for sample cleaning and deposition (sputter cleaning, direct current heating, e-beam heating stage, metal deposition, etc.)
• Variable-temperature scanning tunneling microscope (home-built VT-STM) operates in an UHV environment with a base pressure of < 1E-10 mbar and 55-300 K. Atomic resolution is routinely obtained at room temperature and below. The analysis chamber also houses a LEED/Auger with an attached preparation chamber for sample cleaning and deposition (sputter cleaning, direct current heating, e-beam heating stage, metal deposition).
• Scanning probe microscope Veeco MultiMode 8 [contact or tapping mode, fluid imaging, low-current scanning tunneling microscopy, magnetic force microscopy, variable temperature imaging (-30-250°C), conductive atomic force microscopy, PeakForce tapping mode and PeakForce quantitative nanomechanical mapping]
• Characterization of electrical transport properties at the nanoscale via state-of-the-art UHV nanoprobes (4-tip SEM Omicron UHV Nanoprobe)
• Internal/external quantum efficiency measurement system (Oriel IQE-200)
• Luminescence spectrometer (Perkin-Elmer LS 55)
• Magnetic and physical properties characterization suite ( Keithley 4200-SCS/F Semiconductor Parameter Analyzer, Quantum Design PPMS-9 and MPMS XL)
• Optical microscope (Zeiss Axio Imager Z1 M Upright)
• Rheometer (AntonPaar Physica MCR301)
• Solar simulator (Oriel)
• Thermal analysis [differential scanning calorimetry (Mettler Toledo 823) and thermogravimetric analysis (Mettler Toledo 851)]
• Ultraviolet-visible-near-infrared spectrometer (Perkin-Elmer Lamda 950)
• Variable-temperature magneto-optical microscopy with high-resolution spectroscopy capability.
• X-ray diffractometer (Bruker D8 Discover, point detector, VÅNTEC-1 linear detector; Bragg-Brentano powder, Grazing incidence, high-resolution four-circle, reciprocal space mapping, reflectivity, rocking curves)

Modeling

• Molecular modeling for geometry and electronic structure