X-Ray Microscopy Facilities

In this facility, the nanoprobe beamline provides fluorescence, diffraction, transmission, and tomographic imaging with a spatial resolution of as small as 30 nm. Typical operation provides a spatial resolution of 50 nm in the spectral range of 8-12 keV.

Capabilities

• Hard X-Ray Nanoprobe
• Fixed-energy scanning probe X-ray diffraction microscopy (8-12 keV)
• Fixed-energy scanning probe X-ray fluorescence microscopy (8-12 keV)
• Fixed-energy full-field two-dimensional transmission imaging and tomography (absorption and phase contrast; 8-10 keV)
• Heating/cooling specimen stage offers variable-temperature hard X-ray microscopy over a temperature range of 95-525K. Scanning probe X-ray diffraction, scanning probe X-ray fluorescence, and two-dimensional X-ray imaging at fixed-energy are supported. Sample temperature is selectable at a step of 0.01 K and a stability of 0.005 K. Position change due to temperature step is less than 100 nm/K and can be calibrated to a repeatability of 5 nm per degree step, with an absolute position drift of less than ~10 nm/hr.